This process creates detailed, high-resolution 3D images of a sample's surface. Compared to TEM, SEM offers the advantages of a larger field of view and the ability to analyze thicker samples, ...

This scanning process allows for the collection of various signals generated by electron-sample interactions, such as secondary electrons, backscattered electrons, and X-rays, providing versatile ...

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Basic HIM skills: The HIM is much like a scanning electron microscope (SEM) in size since it has a smaller ion beam energy (10 keV to 40 keV) compared to the electrons in a TEM (80 keV to 200 keV).

However, so far, it has not been possible to acquire different accelerating voltages on the same sample without the loss of the region of interest — all in a single microscopy session. Visualize a ...