This scanning process allows for the collection of various signals generated by electron-sample interactions, such as secondary electrons, backscattered electrons, and X-rays, providing versatile ...

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Basic HIM skills: The HIM is much like a scanning electron microscope (SEM) in size since it has a smaller ion beam energy (10 keV to 40 keV) compared to the electrons in a TEM (80 keV to 200 keV).

Transmission electron microscopy (TEM) is a process that images nanoscale features of a specimen using a beam of electrons. An image is produced when electrons interact with the sample as they pass ...